characteristic x-rays
英 [ˌkærəktəˈrɪstɪk eks ˈreɪz]
美 [ˌkærəktəˈrɪstɪk eks ˈreɪz]
网络 特征X射线; 标识X射线谱; 标识
双语例句
- Therefore, the characteristic X-rays induced by ultralow energy ions injected into seeds are an important mechanism of crop breeding.
因此，赵低能离子注入作物种子激发产生的特征X－射线是其诱变育种的一种重要机制。 - The law of characteristic X-rays emitted by target element under the radiation of isotope source in a range of low energy is discussed.
介绍了在低能范围内利用放射性同位素源发出的初级射线，照射和激发靶片元素产生的特征X射线的规律性； - And other factors that influence this time comparison result are discussed too in the work. In the paper it is pointed out definitely that the characteristic peaks that are disturbed by characteristic X-rays from out-sources ought to be not adopted to determine activities of the samples.
此外，本工作还对影响比对结果的其它因素也做了讨论，它明确指出，那些受外源性特征X射线干扰的特征γ峰不应该被用来测定样品的γ放射性活度。 - Due to the high stripping charge-states during heavy ion-atom collisions, the characteristic X-rays will be shifted upward and the X-ray line will be broadened, the fluorescence yields and the intensity ratio of Ka/ Kp will be changed, and special X-ray will also produced.
而且在重离子与靶材料碰撞时由于产生高剥离态离子使得特征X射线产生能量移动及展宽、荧光产额和Kα/Kβ强度比值发生变化，以及发射特殊X射线等； - In this paper, a Monte Carlo simulation method for calculating intensities of characteristic x-rays, including primary x-rays and secondary fluorescences, of elements in a multicomponent film excited by incident electrons is presented.
作者提出了入射电子在多元组份薄膜中所激发出的薄膜中各种元素的包括初次X射线和二次荧光在内的特征X射线强度的蒙特卡罗模拟计算方法。 - The fast coincidences involve characteristic X-rays and cascade γ rays coming from correlated levels. The system has the advantage of both element and cascade choices.
快符合涉及特征X射线和相应的级联衰变γ射线测量，系统具有元素和级联选择的优点。 - An ultra-thin window Si ( Li) detector used for measuring low energy X-rays is designed. The PIXE spectrum range has extended to still lower energies of characteristic X-rays originated from St, Al and Na.
用超薄窗Si（Li）探测器测量低能X射线，将传统的PIXE谱测量范围推广到如Si、Al、Na等低原子序数元素。 - Finally, we compute the feature parameters of defects, design the characteristic of defects, evaluate X-rays film according to the information of defects and the criterion of film assessing.
最后，结合缺陷的特征参数，参照X射线底片评定标准，确定缺陷的类型和本张底片的级别。